AH478Z5-G1 Просмотр технического описания (PDF) - BCD Semiconductor

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AH478Z5-G1

SINGLE PHASE HALL EFFECT LATCH WITH LOCKED PROTECTION

BCD Semiconductor 

Data Sheet

SINGLE PHASE HALL EFFECT LATCH WITH LOCKED PROTECTION AH478

Electrical Characteristics

(TA=25oC, VCC=14V, unless otherwise specified)

Parameter

Symbol

Test Condition

Output Saturation Voltage (Sink)

Output Saturation Voltage (Drive)

VSAT

IOUT=150mA

IOUT=150mA

Supply Current

Output ON Time

Output OFF Time

Charge Current

Discharge Current

Duty Ratio

Clamp Voltage

Comparator Voltage

Thermal Resistance (Junction to Case)

ICC

TON

TOFF

ICHG

IDHG

DR

VCL

VCP

θJC

VCC=20V, output open

RL=820Ω, CCT=0.47µF

RL=820Ω, CCT=0.47µF

VCT=1 to 2.5V

VCT=3.5 to 2.5V

TOFF/TON

Limiting Voltage

Limiting Voltage

TO-95

Min Typ Max Unit

0.2

0.25

V

VCC- VCC-

VCC

V

1.0

0.8

14

16

mA

135

ms

1

s

3.5

µA

0.5

µA

5

7

10

2.8

V

1.8

V

45

oC/W

Magnetic Characteristics

(TA=25oC)

Parameter

Symbol

Grade

Min

Typ

Max

Unit

Operating Point

A

5

BOP

B

70

Gauss

100

Releasing Point

A

-70

BRP

B

-100

-5

Gauss

Hysteresis

BHYS

70

Gauss

Test Circuit

S

Marking Side

N

Power

Input

C1

10 µF

AH478

(Front View)

CT VCC DO DOB GND

1 2 3 45

CCT

2.2µ F

RL

820Ω

Nov. 2008 Rev. 1. 2

BCD Semiconductor Manufacturing Limited

5

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