AH477AZ4-AG1 Просмотр технического описания (PDF) - BCD Semiconductor

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производитель

AH477AZ4-AG1

SINGLE PHASE HALL EFFECT LATCH

BCD Semiconductor 

SINGLE PHASE HALL EFFECT LATCH

Electrical Characteristics

(TA=25oC, VCC=14V, unless otherwise specified)

Parameter

Output Saturation Voltage (Sink)

Output Saturation Voltage (Drive)

Symbol

VSAT

Test Condition

VCC=14V, IO=200mA

VCC=14V, IO=200mA

Supply Current

Output Rise Time

Output Fall Time

ICC VCC=20V, Output Open

tr

RL=820Ω, CL=20pF

tf

RL=820Ω, CL=20pF

Data Sheet

AH477A

Min Typ Max Unit

0.45 0.65

V

VCC-

1.3

VCC-

1.0

VCC

V

13.5

16

mA

0.5

1.0

µs

0.5

1.0

µs

Magnetic Characteristics

(TA=25oC)

Parameter

Symbol

Grade

Min

Typ

Max

Unit

Operating Point

BOP

A

5

B

70

Gauss

100

Releasing Point

BRP

A

-70

B

-100

-5

Gauss

Hysteresis

BHYS

70

Gauss

Test Circuit

S

Marking Side

N

AH477A

VCC DO DOB GND

1234

VCC

C1

0.1µF

820Ω

Oct. 2009 Rev. 1. 2

BCD Semiconductor Manufacturing Limited

5

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