ADXL375 Просмотр технического описания (PDF) - Analog Devices
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ADXL375 Datasheet PDF : 32 Pages
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Data Sheet
ADXL375
SPECIFICATIONS
TA = 25°C, VS = 2.5 V, VDD I/O = 2.5 V, acceleration = 0 g, CS = 10 µF tantalum, CI/O = 0.1 µF, output data rate (ODR) = 800 Hz, unless
otherwise noted.
Table 1.
Parameter
SENSOR INPUT
Measurement Range2
Nonlinearity
Cross-Axis Sensitivity3
SENSITIVITY
Sensitivity at XOUT, YOUT, ZOUT2, 4
Scale Factor at XOUT, YOUT, ZOUT2, 4
Sensitivity Change Due to Temperature
0 g OFFSET
0 g Output for XOUT, YOUT, ZOUT
0 g Offset vs. Temperature
NOISE
OUTPUT DATA RATE AND BANDWIDTH5
Output Data Rate (ODR)4, 6
SELF-TEST7
Output Change in Z-Axis
POWER SUPPLY
Operating Voltage Range (VS)
Interface Voltage Range (VDD I/O)
Supply Current
Measurement Mode
Standby Mode
Turn-On and Wake-Up Time8
TEMPERATURE
Operating Temperature Range
WEIGHT
Device Weight
Test Conditions/Comments
Each axis
Percentage of full scale
Each axis
ODR ≤ 800 Hz
ODR ≤ 800 Hz
Each axis
X-, y-, and z-axes
User selectable
ODR ≥ 100 Hz
ODR ≤ 3 Hz
ODR = 3200 Hz
Min
±180
18.4
44
−6000
0.1
2.0
1.7
−40
Typ 1
±200
±0.25
±2.5
20.5
49
±0.02
±400
±10
5
6.4
2.5
1.8
145
35
0.1
1.4
30
Max
22.6
54
+6000
3200
3.6
VS
+85
Unit
g
%
%
LSB/g
mg/LSB
%/°C
mg
mg/°C
mg/√Hz
Hz
g
V
V
µA
µA
µA
ms
°C
mg
1 Typical specifications are for at least 68% of the population of parts and are based on the worst case of mean ± 1 σ distribution, except for sensitivity, which represents
the target value.
2 Minimum and maximum specifications represent the worst case of mean ± 3 σ distribution and are not guaranteed in production.
3 Cross-axis sensitivity is defined as coupling between any two axes.
4 The output format for the 1600 Hz and 3200 Hz output data rates is different from the output format for the other output data rates. For more information, see the
Data Formatting at Output Data Rates of 3200 Hz and 1600 Hz section.
5 Bandwidth is the −3 dB frequency and is half the output data rate: bandwidth = ODR/2.
6 Output data rates < 6.25 Hz exhibit additional offset shift with increased temperature.
7 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit = 0.
Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). For the self-test to operate correctly,
the part must be in normal power operation (LOW_POWER bit = 0 in the BW_RATE register, Address 0x2C).
8 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 ms, where τ = 1/(data rate).
Rev. 0 | Page 3 of 32
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