ADXL313WACPZ-RL Просмотр технического описания (PDF) - Analog Devices
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ADXL313WACPZ-RL Datasheet PDF : 28 Pages
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Data Sheet
ADXL313
SPECIFICATIONS
TA = −40°C to +105°C, VS = VDD I/O = 3.3 V, acceleration = 0 g, unless otherwise noted.
Table 1.
Parameter 1
SENSOR INPUT
Measurement Range
Nonlinearity
Micro-Nonlinearity
Interaxis Alignment Error
Cross-Axis Sensitivity2
OUTPUT RESOLUTION
All g Ranges
±0.5 g Range
±1 g Range
±2 g Range
±4 g Range
SENSITIVITY
Sensitivity at XOUT, YOUT, ZOUT
Sensitivity Change Due to Temperature
0 g BIAS LEVEL
Initial 0 g Output
0 g Output Drift over Temperature
0 g Offset Tempco
NOISE PERFORMANCE
Noise Density
RMS Noise
OUTPUT DATA RATE/BANDWIDTH
Measurement Rate3
SELF TEST4
Output Change in X-Axis
Output Change in Y-Axis
Output Change in Z-Axis
POWER SUPPLY
Operating Voltage Range (VS)
Interface Voltage Range (VDD I/O)
Supply Current
Standby Mode Leakage Current
Turn-On (Wake-Up) Time5
TEMPERATURE
Operating Temperature Range
Test Conditions/Comments
Each axis
User selectable
Percentage of full scale
Measured over any 50 mg interval
Each axis
Default resolution
Full resolution enabled
Full resolution enabled
Full resolution enabled
Full resolution enabled
Each axis
Any g-range, full resolution mode
±0.5 g, 10-bit or full resolution
±1 g, 10-bit resolution
±2 g, 10-bit resolution
±4 g, 10-bit resolution
Each axis
T = 25°C, XOUT, YOUT
T = 25°C, ZOUT
−40°C < T < +105°C, XOUT, YOUT, referenced to initial 0 g output
−40°C < T < +105°C, ZOUT, referenced to initial 0 g output
XOUT, YOUT
ZOUT
X-, Y-axes
Z-axis
X-, Y-axes, 100 Hz output data rate (ODR)
Z-axis, 100 Hz ODR
User selectable
Data rate ≥ 100 Hz, 2.0 V ≤ VS ≤ 3.6 V
Data rate > 100 Hz
Data rate < 10 Hz
Min Typ
Max Unit
±0.5, ±1, ±2, ±4
±0.5
±2
±0.1
±1
g
%
%
Degrees
%
10
Bits
10
Bits
11
Bits
12
Bits
13
Bits
1024
921 1024
460 512
230 256
115 128
±0.01
1126
563
282
141
LSB/g
LSB/g
LSB/g
LSB/g
LSB/g
%/°C
−125
−200
±50
±75
±0.5
±0.75
+125
+200
mg
mg
mg
mg
mg/°C
mg/°C
150
µg/√Hz
250
µg/√Hz
1.5
mg rms
2.5
mg rms
6.25
3200 Hz
0.20
−2.36
0.30
2.36 g
−0.20 g
3.70 g
2.0
1.7
100 170
30
55
0.1
1.4
3.6 V
VS
V
300 µA
110 µA
2
µA
ms
−40
+105 °C
1 All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
2 Cross-axis sensitivity is defined as coupling between any two axes.
3 Bandwidth is half the output data rate.
4 Self test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit =
0 (in the DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self test, where τ = 1/(data rate).
5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).
Rev. 0 | Page 3 of 28
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