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ADA-4643 Просмотр технического описания (PDF) - HP => Agilent Technologies

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Компоненты Описание
производитель
ADA-4643
HP
HP => Agilent Technologies HP
ADA-4643 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
ADA-4643 Absolute Maximum Ratings[1]
Symbol
Id
Pdiss
Pin max.
Tj
TSTG
θjc
Parameter
Device Current
Total Power Dissipation [2]
RF Input Power
Channel Temperature
Storage Temperature
Thermal Resistance [3]
Units
mA
mW
dBm
°C
°C
°C/W
Absolute
Maximum
70
270
18
150
-65 to 150
152
Notes:
1. Operation of this device above any one of
these parameters may cause permanent
damage.
2. Ground lead temperature is 25°C.
Derate 6.6 mW/°C for TL >109°C.
3. Junction-to-case thermal resistance
measured using 150°C Liquid Crystal
Measurement method.
ADA-4643 Electrical Specifications
TA = 25°C, Zo=50, Pin = -25 dBm, Id = 35 mA (unless specified otherwise)
Symbol
Parameter and Test Condition:
Id = 35 mA, Zo = 50
Frequency
Units Min. Typ.
Vd
Device Voltage Id= 35 mA
Gp
Power Gain (|S21|2
100 MHz
900 MHz[1,2]
V
3.2
3.5
dB
17.5
15.5
17.0
Gp
Gain Flatness
100 to 900 MHz
dB
0.5
0.1 to 2 GHz
1.8
F3dB
3 dB Bandwidth
GHz
3.2
VSMRin
Input Voltage Standing Wave Ratio
0.1 to 6 GHz
2.0:1
VSMRout
Output Voltage Standing Wave Ratio
0.1 to 6 GHz
1.6:1
NF
50Noise Figure
100 MHz
dB
3.9
900 MHz[1,2]
4.0
P1dB
Output Power at 1dB Gain Compression
100 MHz
dBm
14.7
900 MHz[1,2]
13.4
OIP3
Output 3rd Order Intercept Point
100 MHz[3]
dBm
29.0
900 MHz[1,2,3]
28.3
DV/dT
Device Voltage Temperature Coefficient
mV/°C
-5.3
Notes:
1. Typical value determined from a sample size of 500 parts from 3 wafers.
2. Measurement obtained using production test board described in the block diagram below.
3. I) 900 MHz OIP3 test condition: F1 = 900 MHz, F2 = 905 MHz and Pin = -25 dBm per tone.
II) 100 MHz OIP3 test condition: F1 = 100 MHz, F2 = 105 MHz and Pin = -25 dBm per tone.
Max. Std. Dev.
3.9
18.5
0.07
0.1
Input
50 Ohm
Transmission
(0.5 dB loss)
50 Ohm
Output
Transmission
DUT
including Bias
(0.5 dB loss)
Block diagram of 900 MHz production test board used for Vd, Gain, P1dB, OIP3, and NF measurements.
Circuit losses have been de-embedded from actual measurements.
2

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