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AD5533BBCZ-1

32-Channel Precision Infinite Sample-and-Hold

Analog Devices 

AD5533B

TERMINOLOGY

VIN to VOUT Nonlinearity

This is a measure of the maximum deviation from a straight line

passing through the endpoints of the VIN versus VOUT transfer

function. It is expressed as a percentage of the full-scale span.

Total Unadjusted Error (TUE)

This is a comprehensive specification that includes relative accu-

racy, gain, and offset errors. It is measured by sampling a range

of voltages on VIN and comparing the measured voltages on

VOUT to the ideal value. It is expressed in mV.

Offset Error

This is a measure of the output error when VIN = 70 mV. Ideally,

with VIN = 70 mV:

VOUT = (Gain × 70) − ((Gain − 1) × VOFFS_ IN ) mV

Offset error is a measure of the difference between VOUT (actual)

and VOUT (ideal). It is expressed in mV and can be positive or

negative. See Figure 5.

Gain Error

This is a measure of the span error of the analog channel. It is

the deviation in slope of the transfer function. See Figure 5. It is

calculated as:

Gain Error = Actual Full-Scale Output −

Ideal Full-Scale Output Offset − Error

where

Ideal Full-Scale Output = (Gain × 2.96) − ((Gain − 1) × VOFFS _ IN )

Ideal Gain = 3.52

Output Temperature Coefficient

This is a measure of the change in analog output with changes in

temperature. It is expressed in ppm/°C.

DC Power Supply Rejection Ratio

DC Power Supply Rejection Ratio (PSRR) is a measure of

the change in analog output for a change in supply voltage

(VDD and VSS). It is expressed in dBs. VDD and VSS are varied ±5%.

DC Crosstalk

This is the dc change in the output level of one channel in response

to a full-scale change in the output of all other channels. It is

expressed in µV.

Output Settling Time

This is the time taken from when BUSY goes high to when the

output has settled to ± 0.018%.

Acquisition Time

This is the time taken for the VIN input to be acquired. It is the

length of time that BUSY stays low.

OFFS_IN Settling Time

This is the time taken from a 0 V–3 V step change in input

voltage on OFFS_IN until the output has settled to within ± 0.39%.

Digital Feedthrough

This is a measure of the impulse injected into the analog outputs

from the digital control inputs when the part is not being written

to, i.e., CS/SYNC is high. It is specified in nV-secs and is measured

with a worst-case change on the digital input pins, e.g., from all

0s to all 1s and vice versa.

Output Noise Spectral Density

This is a measure of internally generated random noise. Random

noise is characterized as a spectral density (voltage per root Hertz).

It is measured by acquiring 1.5 V on all channels and measuring

noise at the output. It is measured in nV/√Hz typ.

AC Crosstalk

This is the area of the glitch that occurs on the output of one chan-

nel while another channel is acquiring. It is expressed in nV-secs.

VOUT

OFFSET

ERROR

IDEAL

TRANSFER

FUNCTION

ACTUAL

TRANSFER

FUNCTION

GAIN ERROR +

OFFSET ERROR

0V

70mV

LOWER

DEAD BAND

2.96 3V

VIN

UPPER

DEAD BAND

Figure 5. ISHA Transfer Function

REV. A

–9–

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