74HC2G86(2014) Просмотр технического описания (PDF) - NXP Semiconductors.
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74HC2G86 Datasheet PDF : 15 Pages
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NXP Semiconductors
74HC2G86; 74HCT2G86
Dual 2-input EXCLUSIVE-OR gate
tW
VI 90 %
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Fig 7.
Test data is given in Table 10.
Definitions for test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
74HC2G86
74HCT2G86
VI
GND to VCC
GND to 3 V
tr, tf
6 ns
6 ns
Load
CL
50 pF
50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
74HC_HCT2G86
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 14 March 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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