74F323 Просмотр технического описания (PDF) - Philips Electronics
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производитель
74F323
Philips Electronics
74F323 Datasheet PDF : 7 Pages
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Philips Semiconductors
8-bit universal shift/storage register with synchronous
reset and common I/O pins (3-State)
Product specification
74F323
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VOH
High-level output voltage
Q0, Q7
I/On
VCC = MIN,
VIL = MAX,
VIH = MIN
IOH = –1mA
IOH = –3mA
±10%VCC
±5%VCC
±10%VCC
2.5
2.7
2.5
3.4
V
V
V
±5%VCC
2.7
3.4
V
VOL
Low-level output voltage
VCC = MIN,
VIL = MAX,
VIH = MIN
IOL = MAX
±10%VCC
±5%VCC
0.35 0.50
V
0.35 0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at
maximum input voltage
others
I/On
VCC = MAX, VI = 7.0V
VCC = 5.5V, VI = 5.5V
100
µA
1
mA
IIH
High-level input current
except
I/On
VCC = MAX, VI = 2.7V
20
µA
S0, S1
IIL
Low-level input current
others
VCC = MAX, VI = 0.5V
–1.2
mA
–0.6
mA
Off-state output current,
IIH + IOZH High-level voltage
applied
I/On
only
IIL + IOZL
Off-state output current
Low-level voltage applied
VCC = MAX, VO = 2.7V
VCC = MAX, VO = 0.5V
70
µA
–0.6
mA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICCH
55
75
mA
ICC
Supply current (total)
ICCL
VCC = MAX
65
90
mA
ICCZ
55
85
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb =+ 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1990 Mar 01
5
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