DSP56F802TA80E(2005) Просмотр технического описания (PDF) - Freescale Semiconductor

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DSP56F802TA80E
(Rev.:2005)

16-bit Digital Signal Controllers

Freescale Semiconductor 

DC Electrical Characteristics

Table 3-4 DC Electrical Characteristics (Continued)

Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0–3.6 V, TA = –40° to +85°C, CL ≤ 50pF

Characteristic

Symbol

Min

Typ Max Unit

Input current low (analog inputs, VIN=VSSA)2

Output High Voltage (at IOH)

Output Low Voltage (at IOL)

Output source current

Output sink current

PWM pin output source current3

PWM pin output sink current4

IILA

VOH

VOL

IOH

IOL

IOHP

IOLP

-15

—

15

µA

VDD – 0.7 —

—

V

—

—

0.4

V

4

—

—

mA

4

—

—

mA

10

—

—

mA

16

—

—

mA

Input capacitance

Output capacitance

VDD supply current

Run6 (80MHz Operation)

CIN

COUT

IDDT5

—

8

—

pF

—

12

—

pF

—

120 130

mA

Run6 (60MHz Operation)

—

102 111

mA

Wait7

—

96

102

mA

Stop

—

62

70

mA

Low Voltage Interrupt, external power supply8

VEIO

2.4

2.7

3.0

V

Low Voltage Interrupt, internal power supply9

VEIC

2.0

2.2

2.4

V

Power on Reset10

VPOR

—

1.7

2.0

V

1. Schmitt Trigger inputs are: FAULTA0, TCS, TCK, TMS, TDI, RESET, and TRST

2. Analog inputs are: ANA[0:7], XTAL and EXTAL. Specification assumes ADC is not sampling.

3. PWM pin output source current measured with 50% duty cycle.

4. PWM pin output sink current measured with 50% duty cycle.

5. IDDT = IDD + IDDA (Total supply current for VDD + VDDA)

6. Run (operating) IDD measured using 8MHz clock source. All inputs 0.2V from rail; outputs unloaded. All ports configured as inputs;

measured with all modules enabled.

7. Wait IDD measured using external square wave clock source (fosc = 8MHz) into XTAL; all inputs 0.2V from rail; no DC loads; less

than 50pF on all outputs. CL = 20pF on EXTAL; all ports configured as inputs; EXTAL capacitance linearly affects wait IDD; measured

with PLL enabled.

8. This low voltage interrupt monitors the VDDA external power supply. VDDA is generally connected to the same potential as VDD via

separate traces. If VDDA drops below VEIO, an interrupt is generated. Functionality of the device is guaranteed under transient conditions

when VDDA>VEIO (between the minimum specified VDD and the point when the VEIO interrupt is generated).

56F802 Technical Data, Rev. 7

Freescale Semiconductor

17

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