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317B Просмотр технического описания (PDF) - ON Semiconductor

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317B Datasheet PDF : 12 Pages
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VI
Vin
Cin
0.1 µF
Vout
LM317
LM317
IL
Adjust
IAdj
R1
240
1%
+
CO 1.0 µF
R2
1%
VO (min Load)
RL
VO (max Load)
(max Load)
*
RL
(min Load)
*ĂPulse testing required.
*Ă1% Duty Cycle is suggested.
Load Regulation (mV) = VO (min Load) - VO (max Load)
Load Regulation (% VO) =
VO (min Load) - VO (max Load)
VO (min Load)
x 100
Figure 2. Load Regulation and IAdj/Load Test Circuit
Vin
Vout
LM317
IL
VI
Cin 0.1 µF
Adjust
IAdj
ISET
R2
1%
R1
240
1%
Vref
RL
+
CO 1.0 µF
VO
* Pulse testing required.
* 1% Duty Cycle is suggested.
To Calculate R2: Vout = ISET R2 + 1.250 V
To Calculate R2: Assume ISET = 5.25 mA
Figure 3. Standard Test Circuit
24 V
14 V
f = 120 Hz
Vin
Cin 0.1 µF
Vout
LM317
Adjust
R1
240
1%
D1*
1N4002
RL
+
CO 1.0 µF
Vout = 10 V
VO
R2
1.65 k
1%
+
CAdj
10 µF
*ĂD1 Discharges CAdj if output is shorted to Ground.
Figure 4. Ripple Rejection Test Circuit
http://onsemi.com
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