MS5D1436 Просмотр технического описания (PDF) - Fuji Electric

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Компоненты Описание

производитель

MS5D1436

SILICON DIODE

Fuji Electric 

Test Test

No. Items

1 High Temp.

Storage

2 Low Temp.

Storage

3 Temperature

Humidity

Storage

4 Temperature

Humidity

Bias

5 Unsaturated

Pressurized

Vapor

6 Temperature

Cycle

7 Thermal Shock

8 Steady state

Operating life

9 Intermittent

Operating

Life

10 High Temp.

Reverse Bias

Testing methods and Conditions

Reference Sampling Acceptance

Standard number number

EIAJ ED4701

Temperature :Ｔstg max

B-111A

22

Test duration : 1000h

Temperature : Tstg min

B-112A

22

Test duration : 1000h

Temperature : 85±2°C

B-121A

Relative humidity : 85±5%

test code C

22

Test duration : 1000h

Temperature : 85±2°C

Relative humidity : 85±5%

B-122A

22

Bias Voltage : VRRM× 0.8

test code C

Test duration : 1000h

Temperature : 120±2°C

(0:1)

Relative humidity : 85±5%

B-123A

22

Vapor pressure : 170kPa

test code B

Test duration : 96h

High temp.side : Tstg max

Room temp. : 5〜35℃

Low temp.side : Tstg min

B-131A

22

Duration time : HT 30min,RT 5min LT 30min

Number of cycles : 100 cycles

Fluid : pure water(running water)

High temp.side : 100+0/-5°C

B-141A

22

Low temp.side : 0+5/-0°C

test code A

Duration time : HT 5min,LT 5min

Number of cycles : 100 cycles

Ta=25±5°C

Rated load

D-402

22

Test duration : 1000h

Tj=Tjmax 〜50℃

3min ON, 3min OFF

D-403

22 (0:1)

Test duration : 10000cy

Temperature : Ta= 100 °C

Bias Voltage : VR=VRRM duty=1/2

D-404

22

Test duration : 1000h

Failure Criteria

IR ≦USL x 5

VF≦USL x 1.1

USL:Upper specification Limit

Fuji Electric Co.,Ltd.

MS5D1436 5/12

H04‑004‑03

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