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TZA3026 Просмотр технического описания (PDF) - NXP Semiconductors.

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TZA3026 Datasheet PDF : 15 Pages
First Prev 11 12 13 14 15
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NETWORK ANALYZER
DC-IN
PATTERN
GENERATOR DATA
CLOCK
S-PARAMETER TEST SET
PORT1
PORT2
ZO = 50
ZO = 50
VCC
22 nF
55
8.2
k
330
R
4 or 17
OUT
8 or 14
22 nF
TZA3026
IPHOTO
2
OUTQ 22 nF
7 or 13
9, 10, 11, 12
GND
SAMPLING OSCILLOSCOPE
12
ZO = 50
TRIGGER
INPUT
001aac626
Total impedance of the test circuit (ZT) is calculated by the equation ZT = s21 × (R + ZIN) × 2, where s21 is the insertion loss of ports 1 and 2.
Typical values: R = 330 , ZIN = 75 .
Fig 9. Test circuit

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