WS1M8-XCX Просмотр технического описания (PDF) - White Electronic Designs => Micro Semi
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WS1M8-XCX Datasheet PDF : 6 Pages
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WS1M8-XXX
AC CHARACTERISTICS
(VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C)
Parameter
Symbol
-17
-20
-25
Read Cycle
Min Max Min Max Min Max
Read Cycle Time
tRC
17
20
25
Address Access Time
tAA
17
20
25
Output Hold from Address Change
tOH
0
0
0
Chip Select Access Time
tACS
17
20
25
Output Enable to Output Valid
tOE2
9
10
12
Chip Select to Output in Low Z
tCLZ1
2
2
2
Output Enable to Output in Low Z
tOLZ2
0
0
0
Chip Disable to Output in High Z
tCHZ1
9
10
12
Output Disable to Output in High Z tOHZ2
9
10
12
1. This parameter is guaranteed by design but not tested.
2. OE is internally tied to the GND and not accessible on the WS1M8-XCX.
-35
Min Max
35
35
0
35
25
4
0
15
15
-45
Min Max
45
45
0
45
25
4
0
20
20
-55
Units
Min Max
55
ns
55 ns
0
ns
55 ns
25 ns
4
ns
0
ns
20 ns
20 ns
AC CHARACTERISTICS
(VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C)
Parameter
Symbol
-17
-20
Write Cycle
Min Max Min Max
Write Cycle Time
tWC
17
20
Chip Select to End of Write
tCW
14
14
Address Valid to End of Write
tAW
14
14
Data Valid to End of Write
tDW
9
10
Write Pulse Width
tWP
14
14
Address Setup Time
tAS
0
0
Address Hold Time
tAH
0
0
Output Active from End of Write
tOW1
2
3
Write Enable to Output in High Z tWHZ1
9
9
Data Hold Time
tDH
0
0
1. This parameter is guaranteed by design but not tested.
-25
Min Max
25
15
15
10
15
0
0
4
10
0
-35
Min Max
35
25
25
20
25
0
0
4
15
0
-45
Min Max
45
35
35
25
35
0
5
5
15
0
-55
Units
Min Max
55
ns
50
ns
50
ns
25
ns
40
ns
0
ns
5
ns
5
ns
25 ns
0
ns
AC TEST CIRCUIT
I OL
Current Source
D.U.T.
Ceff = 50 pf
I OH
Current Source
VZ ≈ 1.5V
(Bipolar Supply)
3
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0 V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
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