TS8308500 Просмотр технического описания (PDF) - Atmel Corporation

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производитель

TS8308500

ADC 8-bit 500 Msps

Atmel Corporation 

Explanation of

Test Levels

Table 4. Explanation of Test Levels(3)

Num

1

2

Characteristics

100% production tested at +25°C(1) (for “C” Temperature range(2))

100% production tested at +25°C(1), and sample tested at specified temperatures

(for “V” Temperature range(2))

3

Sample tested only at specified temperatures

4

Parameter is guaranteed by design and characterization testing (thermal steady-state

conditions at specified temperature)

5

Parameter is a typical value only

Note:

1. Unless otherwise specified, all tests are pulsed tests : therefore TC = TA where TC and TA are

case and ambient temperature.

2. Refer to “Ordering Information” on page 48.

3. Only min and max values are guaranteed (typical values are issued from characterization

results).

Functions

Description

Table 5. Functions Description

Name

Function

VCC

VEE

VPLUSD

GND

Positive power supply

Analog negative power supply

Digital positive power supply

Ground

VIN, VINB

CLK, CLKB

Differential analog inputs

Differential clock inputs

<D0:D7>

<D0B:D7B>

Differential output data port

DR, DRB

Differential data ready outputs

OR, ORB

Out of range outputs

GAIN

ADC gain adjust

GORB

Gray or binary digital output select

DIOD/DRRB

Die junction temperature measurement/

asynchronous data ready reset

VCC = +5V

VPLUSD = +0V (ECL)

VPLUSD = +2.4V (LVDS)

VIN

VINB

CLK

CLKB

GAIN

GORG

DIOD/

DRRB

TS8308500

OR

ORB

D0

D7

16 D0B

D7B

DR

DRB

DVEE = -5V VEE = -5V GND

10 TS8308500

2193A–BDC–04/03

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