TQ8015-Q Просмотр технического описания (PDF) - TriQuint Semiconductor
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TQ8015-Q Datasheet PDF : 8 Pages
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TQ8015
Table 4. DC Characteristics1 – Within recommended operating conditions, unless otherwise indicated.
Symbol
VIH
VIL
IIH
IIL
VICM
VIDIF
VIH
VIL
IIH
IIL
VOCM
VODIF
VOH
VOL
IOH
IOL
ICC
IEE
Parameter
ECL Input Voltage High
ECL Input Voltage Low
ECL Input Current High
ECL Input Current Low
ECL Input Common Mode Voltage
ECL Input Differential Voltage (pk-pk)
CMOS Input Voltage High
CMOS Input Voltage Low
CMOS Input Current High
CMOS Input Current Low
ECL Output Common Mode
ECL Output Differential Voltage
ECL Output Voltage High
ECL Output Voltage Low
ECL Output Current High
ECL Output Current Low
Power Supply Current (+)
Power Supply Current (–)
Min
–1100
VTT
–30
–1500
400
3.5
0
–1500
600
–1000
VTT
20
0
Max
–500
–1500
+30
–1100
1200
VCC
1.5
+100
–100
–1100
–600
–1600
27
8
20
–950
Units
mV
mV
µA
µA
mV
mV
V
V
µA
µA
mV
mV
mV
mV
mA
mA
mA
mA
Test Cond.
VIH = –0.7 V
VIL = –2.0 V
VIH = VCC
VIL = 0 V
Notes: 1. Test conditions unless otherwise indicated: VTT = –2.0 V, RLOAD = 50 W to VTT.
Table 5. AC Characteristics1 – Within recommended operating conditions, unless otherwise indicated.
Notes
Symbol
Parameter
Min
Typ
Max
Units
Notes
Maximum Data Rate/Port
Jitter
T1
Channel Propagation Delay
T2
Ch-to-Ch Propagation Delay Skew
T3
CONFIG to Data Out (Oi) Delay
T4
LOAD Pulse Width
T5
CONFIG Pulse Width
T6
IAi to LOAD High Setup Time
T7
LOAD to IAi Low Hold Time
T8
OAi to LOAD High Setup Time
T9
LOAD to OAi Low Hold Time
T10
Load ↑ to CONFIG ↑
T11
RESET Pulse Width
TR,F
Output Rise or Fall Time
1.25
Gb/s
1,2
150
ps pk-pk
1
2000
ps
500
ps
5
ns
7
ns
7
ns
0
ns
3
ns
0
ns
3
ns
0
ns
10
ns
250
400
ps
3
Notes: 1. Test conditions: VTT = –2.0 V, RLOAD = 50 W to VTT; ECL inputs: VIH = –1.1 V; VIL = –1.5 V; CMOS inputs: VIH = 3.5 V, VIL = 1.5 V;
ECL outputs: VOH > –1.0 V, VOL < –1.6 V; ECL inputs rise and fall times < 1 ns; CMOS inputs rise and fall times < 20 ns. A bit error
rate of 1E–13 BER or better for 223–1PRBS pattern, jitter and rise/fall times are guaranteed through characterization.
2. 1.2 Gb/s Non-Return-Zero (NRZ) data equivalent to 600 MHz clock signal.
3. Rise and fall times are measured at the 20% and 80% points of the transition from VOL max to VOL min.
4
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