MC78T12CT Просмотр технического описания (PDF) - ON Semiconductor
Номер в каталоге
Компоненты Описание
производитель
MC78T12CT Datasheet PDF : 12 Pages
| |||
MC78T00 Series
ELECTRICAL CHARACTERISTICS (Vin = 17 V, IO = 3.0 A, 0°C ≤ TJ ≤ 125°C, PO ≤ Pmax (Note 6), unless otherwise noted.)
MC78T12AC
MC78T12C
Characteristics
Symbol Min
Typ
Max
Min
Typ Max Unit
Output Voltage
(5.0 mA ≤ IO ≤ 3.0 A, TJ = +25°C)
(5.0 mA ≤ IO ≤ 3.0 A,
5.0 mA ≤ IO ≤ 2.0 A, 14.5 Vdc ≤ Vin ≤ 27 Vdc)
VO
11.75
12
12.25 11.5
11.5
12
12.5 11.4
Line Regulation (Note 7)
Regline
−
6.0
45
−
(14.5 Vdc ≤ Vin ≤ 35 Vdc, IO = 5.0 mA, TJ = +25°C;
14.5 Vdc ≤ Vin ≤ 35 Vdc, IO = 1.0 A, TJ = +25°C;
16 Vdc ≤ Vin ≤ 22 Vdc, IO = 3.0 A, TJ = +25°C;
14.9 Vdc ≤ Vin ≤ 27 Vdc, IO = 1.0 A)
Vdc
12
12.5
12
12.6
6.0
45
mV
Load Regulation (Note 7)
(5.0 mA ≤ IO ≤ 3.0 A, TJ = +25°C)
(5.0 mA ≤ IO ≤ 3.0 A)
Thermal Regulation
(Pulse = 10 ms, P = 20 W, TA = +25°C)
Regload
−
−
10
30
15
80
Regtherm
−
0.001 0.01
mV
−
10
30
−
15
80
−
0.002 0.03 %VO/W
Quiescent Current
(5.0 mA ≤ IO ≤ 3.0 A, TJ = +25°C)
(5.0 mA ≤ IO ≤ 3.0 A)
IB
mA
−
3.5
5.0
−
3.5
5.0
−
4.0
6.0
−
4.0
6.0
Quiescent Current Change
DIB
(14.5 Vdc ≤ Vin ≤ 35 Vdc, IO = 5.0 mA, TJ = +25°C;
5.0 mA ≤ IO ≤ 3.0 A, TJ = +25°C;
14.9 Vdc ≤ Vin ≤ 27 Vdc, IO = 1.0 A)
−
0.3
1.0
−
0.3
1.0
mA
Ripple Rejection
(15 Vdc ≤ Vin ≤ 25 Vdc, f = 120 Hz,
IO = 2.0 A, TJ = 25°C)
RR
57
67
−
57
67
−
dB
Dropout Voltage (IO = 3.0 A, TJ = +25°C)
Vin − VO
−
2.2
2.5
−
2.2
2.5
Vdc
Output Noise Voltage
(10 Hz ≤ f ≤ 100 kHz, TJ = +25°C)
Vn
−
10
−
−
10
−
mV/VO
Output Resistance (f = 1.0 kHz)
RO
−
2.0
−
−
20
−
mW
Short Circuit Current Limit
(Vin = 35 Vdc, TJ = +25°C)
ISC
−
1.5
−
−
1.5
−
A
Peak Output Current (TJ = +25°C)
Imax
−
5.0
−
−
5.0
−
A
Average Temperature Coefficient
of Output Voltage (IO = 5.0 mA)
TCVO
−
0.5
−
−
0.5
−
mV/°C
6. Although power dissipation is internally limited, specifications apply only for PO ≤ Pmax, Pmax = 25 W.
7. Line and load regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately.
Pulse testing with low duty cycle is used.
http://onsemi.com
4
Share Link: 