CXB1575AQ Просмотр технического описания (PDF) - Sony Semiconductor
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CXB1575AQ Datasheet PDF : 16 Pages
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CXB1575AQ
Electrical Characteristics
• DC characteristics
Item
Supply current
TTL input High voltage
TTL input Low voltage
RDATA/RCK output High voltage
RDATA/RCK output Low voltage
SDE output High voltage
SDE output Low voltage
TTL output High voltage
TTL output Low voltage
Maximum input voltage amplitude
D/DB input resistance
∗1 Ta = 0°C to +85°C
(VCC = +3.069 to +3.465V, VEE = GND, Ta = –40°C to +85°C)
Symbol
Conditions
ICC
All outputs open
Min.
Typ.
Max. Unit
70
100 mA
VIHT
VILT
VOH1∗1
VOL1∗1
VOH2∗1
VOL2∗1
VOHT
51Ω to VCC – 2V
51Ω to VCC – 2V
510Ω to VEE
510Ω to VEE
IOH = –0.2mA
2
0
VCC – 1.1
VCC – 1.88
VCC – 1.1
VCC – 1.88
2.4
3.465 V
0.8
V
VCC – 0.83 V
VCC – 1.55 V
VCC – 0.83 V
VCC – 1.55 V
V
VOLT
Vmax
IOL = 2.1mA
1600
0.5
V
mV
Rin
2250
3000
3750
Ω
• AC characteristics
(VCC = +3.069 to +3.465V, VEE = GND, Ta = –40°C to +85°C)
Item
Symbol
Conditions
Min. Typ. Max. Unit
Post amplifier gain
GL
50
dB
Signal detect hysteresis width
Signal detect response assert time∗1
Signal detect response deassert time∗1
Jitter generation∗2
PLL band width∗2
Jitter peaking∗2
∆P
Tas
Tdas
RJ
FC
HYS = VEER3, Rd = 22kΩ
with 12kHz high pass filter
3
8 dB
0
100 µs
2.3
100 µs
0.008
UIrms
90 130 kHz
0.06 0.1 dB
f = 10Hz
1.5 16
Jitter tolerance∗2, ∗3
f = 30Hz
f = 300Hz
1.5 16
1.5 16
UIp-p
f = 6.5kHz
1.5 4
PLL capture range∗2
PLL pull in time∗2
f = 65kHz
DRSEL = High
Tp
DRSEL = High
0.15 0.5
155.40 155.52 155.60 Mbps
42
ms
RCK, RDATA output rise time
Tr
51Ω to VCC – 2V, 20% to 80%
600 1000 ps
RCK, RDATA output fall time
Tf
51Ω to VCC – 2V, 20% to 80%
600 1000 ps
∗1 D = 155.52Mbps, PN23-1 pattern, 100mVp-p single-ended, Rd = OPEN, CAP2/3 = 470pF
∗2 D = 155.52Mbps, PN23-1 pattern, 20mVp-p single-ended, Cp = 0.68µF
∗3 Bit Error Rate Threshold: 1E – 10
–7–
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