L9230DIE1 Просмотр технического описания (PDF) - STMicroelectronics
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L9230DIE1 Datasheet PDF : 25 Pages
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L9230
Symbol
Parameter
Test Condition
Min. Typ. Max. Unit
t v Data Valid CL = 40pF
Data Valid CL = 200pF
(referred to L9230)
40
ns
150
ns
t su Data Setup Time
(referred to master)
50
ns
t h Data Hold Time
(referred to master)
20
ns
t dis Disable Time
(referred to L9230)
100
ns
t dt Transfer Delay
(referred to master)
150
ns
t SCKH Serial clock high time
(referred to master)
50
µs
t SCKL Access time
(referred to master)
8.35
ns
Clock inactive before
chipselect becomes valid
200
ns
Clock inactive after
chipselect becomes valid
200
ns
t rs rise-, fall time
Load on SO 50pF
20
ns
DIAGNOSTIC
Diagnostic Threshold (Open Load Detection DMS > 4,5V, EN < 0,8V)
VOUT1
VOUT2
Load is available
0.8
V
0.8
V
VOUT1
VOUT2
Load is missing
1
VS
V
0.8
V
IOUT2 Diagnostic Current
-IOUT1
DMS > 4.5V, EN < 0.8V
DMS > 4.5V, EN < 0.8V
700 1000 1300 µA
1000 1500 2000 µA
Tracking Diagnostic Current IOUT1 / IOUT2
1.4
1.5
1.6
tD Delay Time
30
100 ms
10/25
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