74F242 Просмотр технического описания (PDF) - Philips Electronics

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производитель

74F242

Quad transceiver, inverting 3-State

Philips Electronics 

Philips Semiconductors

Transceivers

Product specification

74F242/74F243

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

MIN TYP2 MAX

UNIT

VOH

High-level output voltage

VCC = MIN,

±10%VCC 2.4

VIL = MAX, IOH = –3mA

V

VIH = MIN

±5%VCC

2.7

3.3

VCC = MIN,

±10%VCC 2.0

3.2

VIL = MAX, IOL = –15mA

V

VIH = MIN

±5%VCC

2.0

3.1

VOL

Low-level output voltage

VCC = MIN,

VIL = MAX,

VIH = MIN

IOH=MAX

±10%VCC

±5%VCC

0.55

V

0.42

0.55

VIK

II

IIH

IIL

IIH+IOZH

Input clamp voltage

Input current at

maximum input voltage

High-level input current

Low-level input current

A0–A3, B0–B3

OEA, OEB

OEA, OEB

only

Off-state output current

High-level voltage applied

VCC = MIN, II = IIK

VCC = MAX, VI = 5.5V

VCC = MAX, VI = 7.0V

VCC = MAX, VI = 2.7V

VCC = MAX, VI = 0.5V

VCC = MAX, VO = 2.7V

–0.73 –1.2

V

1

mA

100

µA

20

µA

–1

mA

70

µA

IIL+IOZL

Off-state output current

Low-level voltage

applied

74F242

74F243

VCC = MAX, VO = 0.5V

–1.0

mA

–1.6

IOS

Short-circuit output current3

VCC = MAX

–100

–225

mA

ICCH

22

35

mA

74F242 ICCL VCC = MAX

40

55

mA

ICC

Supply current (total)

ICCZ

ICCH

32

45

mA

64

80

mA

74F243 ICCL VCC = MAX

64

90

mA

ICCZ

71

90

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

1990 Aug 30

5

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