SPT7936SCT Просмотр технического описания (PDF) - Fairchild Semiconductor

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SPT7936SCT

12-BIT, 28 MSPS SAMPLING A/D CONVERTER

Fairchild Semiconductor 

ELECTRICAL SPECIFICATIONS

TA = TMIN-TMAX, VDD1 =VDD2 = 3.3 V, Sampling Rate = 28 MSPS, Differential input signal, 50% duty cycle clock with 2.5 ns rise and fall times, unless otherwise

specified.

PARAMETERS

TEST

CONDITIONS

TEST

LEVEL

SPT7936

MIN

TYP

MAX UNITS

Dynamic Performance

Spurious Free Dynamic Range (SFDR)

Differential Phase (DP)

Differential Gain (DG)

fIN = 5.0 MHz

V

fIN = 10.0 MHz

VI

V

V

67

62

64

0.08

0.27

dB

dB

degrees

%

Digital Inputs

Logic 0 Voltage (VIL)

Logic 1 Voltage (VIH)

Logic 0 Current (IIL)

Logic 1 Current (IIH)

Input Capacitance (CIND)

(VI=VSS)

(VI=VDD)

VI

VI

80% VDD

VI

VI

V

20% VDD

±1 µA

±1 µA

1.8

pF

Digital Outputs

Logic 0 Voltage (VOL)

Logic 1 Voltage (VOH)

Output Hold Time (tH)

Output Delay Time (tD)

(I = +2 mA)

(I = -2 mA)

VI

0.2

VI

85% VDD 90% VDD

V

5

V

8

0.4 V

V

ns

ns

Switching Performance

Maximum Conversion Rate (fS)

Minimum Conversion Rate

Pipeline Delay (See Timing Diagram)

Aperture Jitter σAP

Aperture Delay tAP

VI

28

IV

1

IV

8.0

V

10

V

2

MSPS

MSPS

Clocks

ps

ns

Power Supply

Supply Voltage VDD

Supply Current IDD

ext ref

int ref

Power Dissipation PD

ext ref

int ref

Sleep Mode Current

ext ref

int ref

Sleep Mode Power Dissipation

ext ref

int ref

Power Supply Rejection Ratio (PSRR)

IV

3.0

3.3

3.6 V

VI

75

87 mA

VI

79

91 mA

VI

248

288 mW

VI

260

300 mW

VI

8

9 mA

VI

11

12 mA

VI

25

29 mW

VI

36

40 mW

V

52

dB

TEST LEVEL CODES

All electrical characteristics are subject to the

following conditions: All parameters having min/

max specifications are guaranteed. The Test

Level column indicates the specific device test-

ing actually performed during production and

Quality Assurance inspection. Any blank sec-

tion in the data column indicates that the speci-

fication is not tested at the specified condition.

TEST LEVEL

I

II

III

IV

V

VI

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA = +25 °C, and sample

tested at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design

and characterization data.

Parameter is a typical value for information purposes

only.

100% production tested at TA = +25 °C. Parameter is

guaranteed over specified temperature range.

SPT7936

3

8/1/00

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