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Номер в каталоге
Компоненты Описание
BU9716BKV Просмотр технического описания (PDF) - ROHM Semiconductor
Номер в каталоге
Компоненты Описание
производитель
BU9716BKV
Picture cell driver for STN (LCD driver)
ROHM Semiconductor
BU9716BKV Datasheet PDF : 11 Pages
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Standard ICs
BU9716BK / BU9716BKV
•
Measurement circuit
P. G.
A
I
IH,
L
H
V
2
1
SW
4
2
0.047
µ
F
1 SW
3
2
0.047
µ
F
GND
1000pF, 47k
Ω
CS, CK
DI, RES
V
DD
S1 ~ S32
V
DD1
COM1 ~ COM3
V
DD2
OSC
V
SS
∗
P. G.: Control signal generator for programmable signal generator, etc.
Fig.1
Measurement conditions
Parameter
Input high level voltage
Input low level voltage
Input high level current
Input low level current
Output high level voltage
Output low level voltage
Intermediate output voltage
Current dissipation
AC characteristics
Symbol
V
IH
V
IL
I
IH
I
IL
V
SOH
V
COH
V
SOL
V
COL
V
CM1
V
SM1
V
CM2
V
SM2
V
CM3
I
Q
I
DD
SW1
2
2
3
3
1
2
2
SW2
—
—
1
2
1
2
2
1
2
1
2
—
—
I
DD,
I
Q
A
1 SW
2
SW
1
1
2
2
3
I
O
V
1
V
CM1,
V
CM2,
V
CM3
V
SM1,
V
SM2
V
V
V
SOH,
V
SOL
V
COH,
V
COL
GND
SW3
—
—
1
2
2
1
—
—
SW4
1
2
1
1
1
1
1
Conditions
Set as P.G. input voltage;
mode switching test
V
2
= V
DD
V
2
= V
SS
Pattern 1, I
O
= – 20
µ
A
Pattern 1, I
O
= – 100
µ
A
Pattern 2, I
O
= 20
µ
A
Pattern 2, I
O
= 100
µ
A
Pattern 3
Pattern 4
Pattern 4
Pattern 5
Pattern 5
Pattern 6
Test after power on
Used as P.G. input condition
Measurement pattern
CS
DI
CK
Pattern 1
Fig.2
CS
DI
CK
Pattern 4
Fig.5
CS
DI
CK
Pattern 2
Fig.3
CS
DI
CK
Pattern 5
Fig.6
CS
DI
CK
Pattern 3
Fig.4
CS
DI
CK
Pattern 6
Fig.7
5
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