AS29F040F-55/XT Просмотр технического описания (PDF) - Micross Components

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AS29F040F-55/XT

512K x 8 FLASH UNIFORM SECTOR 5.0V FLASH MEMORY

Micross Components 

FLASH

AS29F040

FIGURE 7: TEST CONDITIONS,

Test Setup

TABLE 6: TEST CONDITIONS,

Test Specifications

CONDITIONS

Output Load

Output Load Capacitance, CL

(including jig capacitance)

Input Rise and Fall Times

Input Pulse Levels

Input timing measurement

reference levels

Output timing measurement

reference levels

-55 ALL OTHERS UNIT

1 TTL Gate

30

100

pF

5

20

ns

0.0 - 3.0 0.45 - 2.4

V

1.5

0.8, 2.0

V

1.5

0.8, 2.0

V

AC CHARACTERISTICS: Read-Only Operations

PARAMETER

Read Cycle Time3

Address to Output Delay

Chip Enable to Output Delay

Output Enable to Output Delay

Chip Enable to Output High Z2, 3

Output Enable to Output High Z2, 3

Output Enable Hold Time3

Output Hold Time From Addresses

CE\ or OE\, Whichever Occurs First

SYMBOL

JEDEC Std

tAVAV tRC

TEST SETUP

MIN

SPEED OPTIONS1

-55 -70 90 -120 -150 UNITS

55 70 90 120 150 ns

tAVQV tACC

CE\ = VIL

OE\ = VIL

MAX 55

70

90 120 150

ns

tELQV tCE OE\ = VIL MAX 55 70 90 120 150 ns

tGLQV tOE

MAX 30 30 35 50 55 ns

tEHQZ tDF

MAX 18 20 20 30 35 ns

tGHQZ tDF

18 20 20 30 35 ns

Read

MIN 0

0

0

0

0

ns

tOEH Toggle and

Data Polling

MIN

10

10

10

10

10

ns

tAXQX tOH

MIN 0

0

0

0

0

ns

NOTES:

1. See Figure 7 and Table 6 for test specifications.

2. Output driver disable time.

3. Not 100% tested.

AS29F040

Rev. 2.3 01/10

15

Micross Components reserves the right to change products or specifications without notice.

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