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CXD1961AQ Просмотр технического описания (PDF) - Sony Semiconductor

Номер в каталоге
Компоненты Описание
производитель
CXD1961AQ
Sony
Sony Semiconductor Sony
CXD1961AQ Datasheet PDF : 33 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
CXD1961AQ
Sub address 0B (hex)
Read
CAR_OFST Carrier Capture offset value
OFC7 to OFC0
OFC7: Sign
Offset frequency at the point of carrier capture
(Latest offset frequency is output to register 02 (hex))
(offset frequency) = (Symbol rate) × OFC [7:0] ÷ 1024 (Hz)
Ex.) 20MSPS OFC [6:0] = 11110000 (bin)
(offset freq.)
= 20MHz × (–16) ÷ 1024
= –312.5kHz
Sub address 0C (hex)
Write
MQS/CLK Qsync mode/Clock recovery
MQS3 to MQS0
(MSB) (LSB)
Threshold for carrier lock detection
AK1 to AK0
CE1 to CE0
Clock recovery loop filter coefficient
00: Max. 11: min.
Clock recovery loop filter gain
00: Min. 11: Max.
Clock recovery range is approximately ±200ppm with CE (1:0) = 11.
Sub address 0D (hex)
Write
CODE/SRS Code rate select/Symbol rate select
RATE2 to RATE0
Code rate setting
RATE2
0
0
0
1
1
1
1
RATE1
0
1
1
0
0
1
1
RATE0
1
0
1
0
1
0
1
Code rate R
1/2
2/3
3/4
4/5
5/6
6/7
7/8
SRSAVE
By saving several NCO control word to sub registers initially, symbol rate can be
changed by setting the number of the sub register in which the desired control
word is saved. There are three sub registers.
– 20 –

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