DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

G121SN01V2 Просмотр технического описания (PDF) - AU Optronics

Номер в каталоге
Компоненты Описание
производитель
G121SN01V2
Auo
AU Optronics  Auo
G121SN01V2 Datasheet PDF : 26 Pages
First Prev 21 22 23 24 25 26
www.DataSheet4U.net
Product Specification
AU OPTRONICS CORPORATION
G121SN01 V2
8. Reliability Test Criteria
Items
Required Condition
High Temperature
Operation
65, 240Hrs (center point of panel surface)
Low Temperature
Operation
-10, 240Hrs
Hot Storage
70, 240Hrs
Cold Storage
-30, 240Hrs
High temperature
high humidity
&
40,
90%RH,
240Hrs
operation
(No condensation)
Shock Test
(Non-Operating)
50G/11ms, ±X, ±Y, ±Z, half-Sin, one time
Vibration Test
(Non-Operating)
ESD
1.5G, 10HZ ~ 200HZ ~ 10HZ
30 minutes for each Axis (X, Y, Z)
Contact Discharge: Max±8KV, 150pF(330Ω) 1sec, 8 points, 25
times/point.
Air Discharge: Max ±15KV, 150pF(330Ω) 1sec, 8 points, 25
times/point
Thermal shock
(non-operation)
1. -20±330minutes
60±330minutes
2. 100 cycles
3. Temperature transition time within 5 minutes
Note
Note 1, 2, 3
Note 1, 2, 3
Note 1, 2, 3
Note 1, 2, 3
Note 1, 2, 3
Note 1, 2, 3
Note 1, 2, 3
Note 3, 4
Note 1, 2, 3
Attitude Test
Operation:10,000ft / 8hrs
Non-Operation: 40,000ft / 24hrs
Note 3
Note 1: Evaluation should be tested after storage at room temperature for one hour.
Note 2: There should be no change which might affect the practical display function when the display
quality test is conducted under normal operating condition.
Note 3: Judgment: 1. Function OK 2. No serious image quality degradation
Note 4: According to EN61000-4-2 , ESD class B: Some performance degradation allowed. No data lost,
self-recoverable. No hardware failures.
G121SN01 V2 rev.0.0
21/26

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]