MFRC52201HN1/TRAYBM_10 Просмотр технического описания (PDF) - NXP Semiconductors.

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MFRC52201HN1/TRAYBM_10

Contactless reader IC

NXP Semiconductors. 

NXP Semiconductors

MFRC522

Contactless reader IC

Table 158. Test signal descriptions …continued

AnalogSelAux1[3:0]

or

AnalogSelAux2[3:0]

value

Signal on pin AUX1 or pin AUX2

1101

RxActive

1110

subcarrier detected

1111

TstBusBit

16.1.3.1 Example: Output test signals TestDAC1 and TestDAC2

The AnalogTestReg register is set to 11h. The output on pin AUX1 has the test signal

TestDAC1 and the output on pin AUX2 has the test signal TestDAC2. The signal values of

TestDAC1 and TestDAC2 are controlled by the TestDAC1Reg and TestDAC2Reg

registers.

Figure 28 shows test signal TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2 when the

TestDAC1Reg register is programmed with a slope defined by values 00h to 3Fh and the

TestDAC2Reg register is programmed with a rectangular signal defined by values 00h

and 3Fh.

001aak597

(1)

(2)

100 ms/div

(1) TestDAC1 (500 mV/div) on pin AUX1.

(2) TestDAC2 (500 mV/div) on pin AUX2.

Fig 28. Output test signals TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2

16.1.3.2 Example: Output test signals Corr1 and MinLevel

Figure 29 shows test signals Corr1 and MinLevel on pins AUX1 and AUX2, respectively.

The AnalogTestReg register is set to 24h.

MFRC522_34

Product data sheet

PUBLIC

All information provided in this document is subject to legal disclaimers.

Rev. 3.4 — 5 March 2010

112134

© NXP B.V. 2010. All rights reserved.

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