Acknowledgements
The authors acknowledge the contribution of the following groups:
System Engineering (Sunnyvale, CA)
CAD Support (Irvine, CA)
RF Engineering (Irvine, CA)
Operations and Test Engineering (Irvine, CA)
In particular the contributions of the following individuals are greatly appreciated:
H. Darabi, B. Yeung, S. Tian, Terje Gloerstad, D. Yang, J. Castaneda, S. Anand
C. Hansen, T. Moorti, R. Gaikwad, J. Lauer, L. Hoo, S. Garlapati, M. Kobayashi
A. Bagchi, G. Kondylis, B. Edwards, M. Matson, M. Fischer, J. Pattin, C. Chu
C. Young, L. Yamano, L. Wu, V. Kodavati, T. Kwan, D. Sobel, A. Woo, L. Burns
T. V. Nguyen, M. Chok, P. Wong, A. Ito, B. Bacher, J. To, R. Graham, G. Loyola