CP2114
Table 13. Absolute Maximum Ratings
Parameter
Test Condition Min
Typ
Max
Unit
Ambient Temperature Under Bias
–55
—
125
°C
Storage Temperature
Voltage on RST, GPIO, I2S, I2C, or UART Pins with
respect to GND
VIO > 2.2 V
VIO < 2.2 V
–65
—
150
°C
–0.3
—
5.8
V
–0.3
—
VIO +
3.6
Voltage on VBUS with respect to GND
VDD > 3.0 V
VDD not powered
–0.3
–0.3
—
5.8
V
—
VDD +
3.6
Voltage on VDD or VIO with respect to GND
Maximum Total Current through VDD, VIO, and GND
Maximum Output Current Sunk by RST or any I/O pin
–0.3
—
—
—
—
—
4.2
V
500
mA
100
mA
Note: Stresses above those listed may cause permanent damage to the device. This is a stress rating only, and functional
operation of the devices at or exceeding the conditions in the operation listings of this specification is not implied.
Exposure to maximum rating conditions for extended periods may affect device reliability.
12
Rev. 1.1