MPU9150 Просмотр технического описания (PDF) - Unspecified
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MPU9150 Datasheet PDF : 50 Pages
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MPU-9150 Product Specification
Document Number: PS-MPU-9150A-00
Revision: 4.3
Release Date: 9/18/2013
12 Reliability
12.1 Qualification Test Policy
InvenSense’s products complete a Qualification Test Plan before being released to production. The
Qualification Test Plan for the MPU-9150 followed the JESD 47I Standards, “Stress-Test-Driven Qualification
of Integrated Circuits,” with the individual tests described below.
12.2 Qualification Test Plan
Accelerated Life Tests
TEST
(HTOL/LFR)
High Temperature Operating Life
(HAST)
Highly Accelerated Stress Test (1)
(HTS)
High Temperature Storage Life
Method/Condition
JEDEC JESD22-A108D
Dynamic, 3.63V biased, Tj>125°C
[read-points 168, 500, 1000 hours]
JEDEC JESD22-A118A
Condition A, 130°C, 85%RH, 33.3 psia., unbiased,
[read-point 96 hours]
JEDEC JESD22-A103D
Condition A, 125°C Non-Bias Bake
[read-points 168, 500, 1000 hours]
Lot
Quantity
3
Sample /
Lot
77
Acc /
Reject
Criteria
(0/1)
3
77
(0/1)
3
77
(0/1)
Device Component Level Tests
TEST
(ESD-HBM)
ESD-Human Body Model
Method/Condition
JEDEC JS-001-2012
(2KV)
Lot
Quantity
1
Sample /
Lot
3
Acc /
Reject
Criteria
(0/1)
(ESD-MM)
ESD-Machine Model
(LU)
Latch Up
(MS)
Mechanical Shock
(VIB)
Vibration
(TC)
Temperature Cycling (1)
JEDEC JESD22-A115C
(250V)
JEDEC JESD-78D
Class II (2), 125°C; ±100mA
JEDEC JESD22-B104C, Mil-Std-883
Method 2002.5, Cond. E, 10,000g’s, 0.2ms,
±X, Y, Z – 6 directions, 5 times/direction
JEDEC JESD22-B103B
Variable Frequency (random), Cond. B, 5-500Hz,
X, Y, Z – 4 times/direction
JEDEC JESD22-A104D
Condition G [-40°C to +125°C],
Soak Mode 2 [5’],
[Read-Points 1000 cycles]
1
3
(0/1)
1
6
(0/1)
3
5
(0/1)
1
5
(0/1)
3
77
(0/1)
(1) Tests are preceded by MSL3 Preconditioning in accordance with JEDEC JESD22-A113F
Proprietary and Confidential
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