ATSAM3N1BA-AU Просмотр технического описания (PDF) - Atmel Corporation

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производитель

ATSAM3N1BA-AU

ARM-based Flash MCU

Atmel Corporation 

SAM3N Summary

7.7 Debug and Test Features

• Debug access to all memory and registers in the system, including Cortex-M3 register bank

when the core is running, halted, or held in reset.

• Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access

• Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches

• Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and

system profiling

• Instrumentation Trace Macrocell (ITM) for support of printf style debugging

• IEEE1149.1 JTAG Boundary-can on All Digital Pins

29

11011BS–ATARM–22-Feb-12

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