M39003 Просмотр технического описания (PDF) - Vaishali Semiconductor

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M39003

Solid-Electrolyte TANTALEX® Capacitors, Military MIL-C-39003 Qualified, Syles CSR13, 21, 23, 33

Vaishali Semiconductor 

M39003/01/03/06/09

Vishay Sprague

Solid-Electrolyte TANTALEX® Capacitors,

Military MIL-C-39003 Qualified, Syles CSR13, 21, 23,

33

WEIBULL DISTRIBUTION METHOD FOR

DETERMINING FAILURE RATE, MIL-C-39003 ( Cont’d)

If no failures occur, the lot can be re-started at a higher stress

level only once. If no failures occur at the higher stress level,

the lot is not suitable for Weibull analysis.

t0 15 min 2 hrs £ t1 £ 10 hrs

40 hrs

After a minimum of 40 hours, the failure count is again taken.

If no further failures occur, one is added to the count. Failure

rate is calculated by the following:

Z(t) = [-ß 1n (1-P2)105]/t2A.F.

Where

Z(t) = Failure Rate

ß = Weibull shape parameter (slope of the line

between t1 & t2 graphed on paper with a 1n (t)

abscissa and 1n 1n (1/(1-P)) ordinate

P = Ratio of failures to units on test at stop time

t2 = Number of hours on test

A.F. = Acceleration Factor

The failure rate can be calculated from the previous formula

as follows:

Z(t) = [-ß 1n (1-P)105]/t A.F.

Z(t) = [-0.2119 1n (1-0.0326)105]/40(17356)

Z(t) = [-0.2119 (-0.0331) 105]/6.9424 (105)

Z(t) = [0.0070/6.9424]

Z(t) = 0.0010 %/1000 hrs

ACTUAL WEIBULL TEST ANALYSIS FOR THE VISHAY SPRAGUE® EQUIPMENT

www.vishay.com

17

For technical questions, contact: tantalum@vishay.com

Document Number: 40018

Revision: 08-Feb-06

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