A29L004 Series
DC Characteristics
CMOS Compatible
Parameter
Symbol
Parameter Description
ILI
Input Load Current
ILIT
A9 Input Load Current
ILO
Output Leakage Current
Test Description
VIN = VSS to VCC. VCC = VCC Max
VCC = VCC Max, A9 =12.5V
VOUT = VSS to VCC. VCC = VCC Max
Min.
Typ.
Max. Unit
±1.0 µA
35
µA
±1.0 µA
VCC Active Read Current
ICC1
(Notes 1, 2)
CE = VIL, OE = VIH
Byte Mode
CE = VIL, OE = VIH
Word Mode
5 MHz
1 MHz
5 MHz
1 MHz
4
10
2
4
mA
4
10
2
4
ICC2
ICC3
ICC4
ICC5
VIL
VIH
VID
VOL
VOH1
VOH2
VCC Active Write (Program/Erase)
Current (Notes 2, 3, 4)
VCC Standby Current (Note 2)
VCC Standby Current During Reset
(Note 2) (N/A on 32-pin PLCC &
(s)TSOP packages)
Automatic Sleep Mode
(Note 2, 4, 5)
Input Low Level
Input High Level
Voltage for Autoselect and
Temporary Unprotect Sector
Output Low Voltage
Output High Voltage
CE = VIL, OE =VIH
CE = VIH, RESET= VCC ± 0.3V
RESET= VSS ± 0.3V
VIH = VCC ± 0.3V; VIL = VSS ± 0.3V
VCC = 3.3 V
IOL = 4.0mA, VCC = VCC Min
IOH = -2.0 mA, VCC = VCC Min
IOH = -100 µA, VCC = VCC Min
20
30 mA
0.2
5
µA
0.2
5
µA
0.2
5
µA
-0.5
0.7 x VCC
0.8
V
VCC + 0.3 V
11.5
0.85 x VCC
VCC - 0.4
12.5 V
0.45 V
V
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE at VIH. Typical VCC is 3.0V.
2. Maximum ICC specifications are tested with VCC = VCC max.
3. ICC active while Embedded Algorithm (program or erase) is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30ns. Typical sleep mode
current is 200nA.
5. Not 100% tested.
PRELIMINARY (October, 2002, Version 0.0)
20
AMIC Technology, Corp.