S-8211DAB-I6T1G Просмотр технического описания (PDF) - Seiko Instruments Inc

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S-8211DAB-I6T1G

BATTERY PROTECTION IC FOR 1-CELL PACK

Seiko Instruments Inc 

Rev.4.5_00

BATTERY PROTECTION IC FOR 1-CELL PACK

S-8211D Series

Table 3

Delay Time

Combination

Overcharge

Detection

Delay Time

tCU

Overdischarge

Detection

Delay Time

tDL

Discharge Overcurrent

Detection

Delay Time

tDIOV

Load Short-circuiting

Detection

Delay Time

tSHORT

(1)

1.2 s

150 ms

9 ms

300 µs

(2)

1.2 s

75 ms

9 ms

300 µs

Remark The delay times can be changed within the range listed Table 4. For details, please contact our sales office.

Table 4

Delay Time

Symbol

Selection Range

Remark

Overcharge detection delay time

tCU

143 ms 573 ms 1.2 s Select a value from the left.

Overdischarge detection delay time

tDL

38 ms 150 ms 300 ms Select a value from the left.

Discharge overcurrent detection delay time

tDIOV

4.5 ms

9 ms

18 ms Select a value from the left.

Load short-circuiting detection delay time

tSHORT

−

300 µs 560 µs Select a value from the left.

Remark The value surrounded by bold lines is the delay time of the standard products.

Seiko Instruments Inc.

5

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