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S-8241ACQMC-GCQT2G Просмотр технического описания (PDF) - Seiko Instruments Inc

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Компоненты Описание
производитель
S-8241ACQMC-GCQT2G
SII
Seiko Instruments Inc SII
S-8241ACQMC-GCQT2G Datasheet PDF : 38 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
Rev.7.6_00
3 Detection delay time
(1) S-8241ABA, S-8241ABC, S-8241ABD, S-8241ABE, S-8241ABF, S-8241ABG, S-8241ABH,
S-8241ABI, S-8241ABK, S-8241ABL, S-8241ABQ, S-8241ABT, S-8241ABU, S-8241ABV,
S-8241ABX, S-8241ABZ, S-8241ACA, S-8241ACB, S-8241ACE, S-8241ACF, S-8241ACG,
S-8241ACH, S-8241ACL, S-8241ACO, S-8241ACP, S-8241ACQ, S-8241ACR, S-8241ACS,
S-8241ACT, S-8241ACU, S-8241ACX, S-8241ACY, S-8241ADA, S-8241ADD, S-8241ADH,
S-8241ADL, S-8241ADM, S-8241ADN, S-8241ADO, S-8241ADQ, S-8241ADT, S-8241ADV
Table 10
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit Condition Circuit
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
tCU
0.7 1.0 1.3
s
8
1
Overdischarge detection delay time
tDL
87.5 125 162.5 ms
8
1
Overcurrent 1 detection delay time
tlOV1
5.6
8 10.4 ms
9
1
Overcurrent 2 detection delay time
tlOV2
1.4
2
2.6 ms
9
1
Load short-circuiting detection delay time tSHORT
10 50 μs
9
1
DELAY TIME (Ta = 40 to +85 °C) *1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
tCU
tDL
tIOV1
tIOV2
tSHORT
0.55 1.0 1.7
s
8
1
69 125 212 ms
8
1
4.4
8
14 ms
9
1
1.1
2
3.4 ms
9
1
10 73 μs
9
1
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
(2) S-8241ABB, S-8241ABO, S-8241ABP, S-8241ABS, S-8241ACI, S-8241ACK, S-8241ACN,
S-8241ACZ, S-8241ADE
Table 11
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit Condition Circuit
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
tCU
87.5 125 162.5 ms
8
1
Overdischarge detection delay time
tDL
21 31 41 ms
8
1
Overcurrent 1 detection delay time
tlOV1
11 16 21 ms
9
1
Overcurrent 2 detection delay time
tlOV2
1.4
2
2.6 ms
9
1
Load short-circuiting detection delay time tSHORT
10 50 μs
9
1
DELAY TIME (Ta = 40 to +85 °C) *1
Overcharge detection delay time
tCU
69 125 212 ms
8
1
Overdischarge detection delay time
tDL
17 31 53 ms
8
1
Overcurrent 1 detection delay time
tIOV1
9
16 27 ms
9
1
Overcurrent 2 detection delay time
tIOV2
1.1
2
3.4 ms
9
1
Load short-circuiting detection delay time tSHORT
10 73 μs
9
1
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
12
Seiko Instruments Inc.

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