Semiconductor
MS81V10160
Parameter
Write Latency
Read Latency
WE Write Control Latency
IE Write Control Latency
RE Read Control Latency
OE Read Control Latency
Symbol
tWL
tRL
tWEL
tIEL
tREL
tOEL
MS81V10160-12, MS81V10160-15
Unit
4
clk
4
clk
2
clk
2
clk
2
clk
2
clk
AC Characteristic Measuring Conditions
Output Compare Level
Output Load
Input Signal Level
Input Signal Rise/Fall Time
Input Signal Measuring Reference Level
1.4 V
1 TTL + 30 pF
3.0 V/0.0 V
1 ns
1.4 V
Note: Input voltage levels for the AC characteristic measurement are VIH = 3.0 V and VIL = 0 V.
When transition time tT becomes 1 ns or more, the input signal reference levels for the parameter
measurement are VIH (min.) and VIL (max.).
9/18