Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits
English
한국어
日本語
русский
简体中文
español
Номер в каталоге
Компоненты Описание
PQ015EZ01ZP_ Просмотр технического описания (PDF) - Sharp Electronics
Номер в каталоге
Компоненты Описание
производитель
PQ015EZ01ZP_
DEVICE SPECIFICATION FOR VOLTAGE REGULATOR
Sharp Electronics
PQ015EZ01ZP_ Datasheet PDF : 19 Pages
1
2
3
4
5
6
7
8
9
10
Next
Last
SHfiRP CORPOMTION
The reliability of products shall satisfy items listed below.
Confidence level : 90%
LTPD : 10%/20%
Test Items
Temperature
cycung
Humidity
(Steady State)
Damp Heat cyclic
High temp. storage
Low temp. storage
Operation life
Mechanical shock
Vibration
[variable
frequency)
Electrostatic
discharge
Soldering heat
Robustness of
Termination
(Tensile test)
Robustness of
Termination
(Bending test]
Solderablllty
Test Conditions
1 cycle -4OC to +15OC
(3(hninl (3Omfm
20 cycles test
+6OC .9O%RH. lOOOh
Failure Judgement
Criteria
Vo<LXO.8
n=22. C=O
vo>UX1.2
n=22, C=O
1 cycle : -20C to 7OC
(2hl (2h)
Transfer time between high
and low temp. is 1h.
40 cycles test, 9O%RH
RegLxJx 1.2
RegI>UX 1.2
n=22. C=O
+150%. lOOOh
RKLXO.8
n=22, C=O
-40-C, lOOOh
- vi-o>UX1.2 ‘4
Ta=25C, Pd=0.8W. lOOOh
n=22, C=O
n=22. C=O
15km/s*. 0.5ms
3 times/ *X *Y. *Z
n=ll. C=O
200m/s2
100 to 2000 to lOOHz/4 mm
4 times/ X. Y. 2 directton
-+25OV. 2OOpF. 00
Between GND and each
tee/
3 times
260%. 10 s. Dip up to
0.5mm from resin portion
l
l
U: Upper
spe&catton
limit
n=ll, C=O
L: Lower
n=ll. C=O
specffication i
limit
.’ ’
n=ll. C=O
Weight: 1ON
10 s/ each terminal
l
2
Weight: 2.5N
0’
-go= -0’ --go= -0’
each terminal
l
3
Failure if it has
breakdown and
loosened pin.
5
n=ll, C=O
’
n=ll. C=O
230+5C. 5+0.5 s
Userogtnflux
l
1
Failure if solder
shall not be adhere
at the area of 95%
or more dipped
portion. +6
n=l1. C=O
Share Link:
datasheetq.com [
Privacy Policy
]
[
Request Datasheet
] [
Contact Us
]