HI1276AIL Просмотр технического описания (PDF) - Intersil
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HI1276AIL Datasheet PDF : 11 Pages
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Test Circuits (Continued)
HI1276
-5.2V A IEED
60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44
61
43
62
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64
40
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68
36
1
HI1276
35
2
34
3
33
4
32
5
31
6
30
-2V
7
29
8
28
9
27
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26
A IEEA
-5.2V
A IIN
-1V
FIGURE 15. POWER SUPPLY AND ANALOG INPUT BIAS CURRENT TEST CIRCUIT
100MHz
OSC1
φ: VARIABLE
fR
AMP
VIN
CLK
OSC2
100MHz
ECL
BUFFER
HI1276
8
LOGIC
ANALYZER
1024
SAMPLES
VIN
CLK
∆υ
∆t
VIN
CLK
129
t
128
127
126
125
APERTURE JITTER
0V
-1V
-2V
σ (LSB)
Aperture jitter is defined as follows:
tAJ = σ ⁄ ∆-∆----υ-t = σ ⁄ 2----52---6-- × 2πf ,
Where σ (unit: LSB) is the deviation of the output codes when the
input frequency is exactly the same as the clock and is sampled at
the largest slew rate point.
FIGURE 16A.
FIGURE 16B. APERTURE JITTER TEST METHOD
FIGURE 16. SAMPLING DELAY AND APERTURE JITTER TEST CIRCUIT
4-10
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