NLSX3014 Просмотр технического описания (PDF) - ON Semiconductor
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NLSX3014 Datasheet PDF : 10 Pages
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NLSX3014
TEST CONDITIONS
1. TA = +25°C,
2. Input Applied to 1 channel, the other 3 inputs are grounded,
3. CLoad = 15 pF
7
6
5
VCC = 3.3 V, VL = 2.5 V
4
VCC = 2.8 V, VL = 1.8 V
3
2
1
0
0
1
5
10
25
50
FREQUENCY (MHz)
Figure 7. ICC vs. Frequency
(Input = I/O VCC, Output = I/O VL)
2.5
2
VCC = 3.3 V, VL = 2.5 V
1.5
VCC = 2.8 V, VL = 1.8 V
1
0
0
1
5
10
25
50
FREQUENCY (MHz)
Figure 8. IL vs. Frequency
(Input = I/O VCC, Output = I/O VL)
5
4
VCC = 3.3 V, VL = 2.5 V
3
2 VCC = 2.8 V, VL = 1.8 V
1
0
0
1
5
10
25
50
FREQUENCY (MHz)
Figure 9. ICC vs. Frequency
(Input = I/O VL, Output =I/O VCC)
700
600
500
400
300
200
100
0
0
VCC = 3.3 V, VL = 2.5 V
VCC = 2.8 V, VL = 1.8 V
1
5
10
25
50
FREQUENCY (MHz)
Figure 10. IL vs. Frequency
(Input = I/O VL, Output = I/O VCC)
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