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NCV8570 Просмотр технического описания (PDF) - ON Semiconductor

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NCV8570 Datasheet PDF : 12 Pages
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NCV8570
ELECTRICAL CHARACTERISTICS
(Vin = Vout + 0.5 V, VCE = 1.2 V, Cin = 0.1 mF, Cout = 1 mF, Cnoise = 10 nF, TA = 40C to 85C, unless otherwise specified (Note 2))
Characteristic
Test Conditions
Symbol Min
Typ
Max
Unit
REGULATOR OUTPUT
Input Voltage
Output Voltage (Note 3)
1.8 V
2.5 V
2.75 V
2.8 V
3.0 V
3.3 V
Vin = (Vout +0.5 V) to 5.5 V
Iout = 1 mA
Vin
2.5
5.5
V
Vout
1.764
1.836
V
2.450
2.550
2.695
2.805
2.744
2.856
2.940
3.060
3.234
3.366
(2%)
(+2%)
Output Voltage (Note 3)
1.8 V
2.5 V
2.75 V
2.8 V
3.0 V
3.3 V
Vin = (Vout +0.5 V) to 5.5 V
Iout = 1 mA to 200 mA
Vout
1.746
1.854
V
2.425
2.575
2.6675
2.8325
2.716
2.884
2.910
3.090
3.201
3.399
(3%)
(+3%)
Power Supply Ripple Rejection
Vin = Vout +1.0 V + 0.5 Vpp
PSRR
dB
Iout = 1 mA to 150 mA
f = 120 Hz
80
Cnoise = 100nF
f = 1 kHz
80
f = 10 kHz
65
Line Regulation
Load Regulation
Output Noise Voltage
Vin = (Vout +0.5 V) to 5.5 V, Iout = 1 mA Regline
0.2
Iout = 1 mA to 200 mA
Regload
12
f = 10 Hz to 100 kHz
Vn
Iout = 1 mA to 150 mA Cnoise = 100 nF
Cnoise = 10 nF
15
20
0.2
%/V
25
mV
mVrms
Output Current Limit
Output Short Circuit Current
Dropout Voltage (Note 4, 5)
2.5 V
2.75 V
2.8 V
3.0 V
3.3 V
Vout = Vout(nom) – 0.1 V
Vout = 0 V
Iout = 150 mA
ILIM
200
310
470
mA
ISC
210
320
490
mA
VDO
105
155
mV
105
155
105
155
100
150
100
150
Dropout Voltage (Note 6)
2.5 V
2.75 V
2.8 V
3.0 V
3.3 V
Iout = 200 mA
VDO
170
215
mV
150
205
150
205
140
200
130
200
GENERAL
Ground Current
Disable Current
Thermal Shutdown Threshold (Note 4)
Thermal Shutdown Hysteresis (Note 4)
CHIP ENABLE
Iout = 1 mA
Iout = 200 mA
VCE = 0 V
IGND
IDIS
TSD
TSH
70
90
mA
110
220
0.1
1
mA
150
C
20
C
Input Threshold
Low
High
Vth(CE)
0.4
V
1.2
Internal PullDown Resistance (Note 7)
TIMING
RPD(CE)
2.5
5
10
MW
Turnon Time
Iout = 150 mA
Cnoise = 10 nF
ton
Cnoise = 100 nF
0.4
ms
4
Turnoff Time
Cnoise = 10 nF/100 nF
Iout = 1 mA
toff
Iout = 10 mA
800
ms
200
2. Performance guaranteed over the indicated operating temperature range by design and/or characterization, production tested at
TJ = TA = 25C. Low duty cycle pulse techniques are used during testing to maintain the junction temperature as close to ambient as possible.
3. Contact factory for other voltage options.
4. Guaranteed by design and characterization.
5. Characterized when output voltage falls 100 mV below the regulated voltage at Vin = Vout + 1 V if Vout < 2.5 V, then VDO = Vin Vout at Vin = 2.5 V.
6. Measured when output voltage falls 100 mV below the regulated voltage at Vin = Vout + 0.5 V if Vout < 2.5 V, then VDO = Vin Vout at Vin = 2.5 V.
7. Expected to disable device when CE pin is floating.
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