MX29F001B Просмотр технического описания (PDF) - Macronix International

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производитель

MX29F001B

1M-BIT [128K x 8] CMOS FLASH MEMORY

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

MX29F001T/B

1.6K ohm

+5V

CL

1.2K ohm

DIODES=IN3064

OR EQUIVALENT

CL=100pF Including jig capacitance

SWITCHING TEST WAVEFORMS

2.4 V

0.45 V

INPUT

2.0V

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall times are < 10ns.

P/N: PM0515

REV. 2.6, DEC. 29, 2003

17

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