DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

MBM29DL800BA-70 Просмотр технического описания (PDF) - Spansion Inc.

Номер в каталоге
Компоненты Описание
производитель
MBM29DL800BA-70
Spansion
Spansion Inc. Spansion
MBM29DL800BA-70 Datasheet PDF : 57 Pages
First Prev 21 22 23 24 25 26 27 28 29 30 Next Last
MBM29DL800TA-70/90/MBM29DL800BA-70/90
s AC CHARACTERISTICS
• Read Only Operations Characteristics
Parameter
Read Cycle Time
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
Output Hold Time From Addresses,
CE or OE, Whichever Occurs First
RESET Pin Low to Read Mode
CE to BYTE Switching Low or High
Symbols
JEDEC
tAVAV
tAVQV
tELQV
tGLQV
tEHQZ
tGHQZ
Standard
tRC
tACC
tCE
tOE
tDF
tDF
Test
Setup
CE = VIL
OE = VIL
OE = VIL
tAXQX
tOH
tREADY
tELFL
tELFH
Note: Test Conditions:
Output Load: 1TTL gate and 30 pF (MBM29DL800TA/BA-70)
1TTL gate and 100 pF (MBM29DL800TA/BA-90
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V or 3.0 V
Timing measurement reference level
Input: 1.5 V
Output:1.5 V
Value (Note)
-70
-90
Unit
Min Max Min Max
70 — 90 — ns
— 70 — 90 ns
— 90 — 90 ns
— 30 — 35 ns
— 25 — 30 ns
— 25 — 30 ns
0 — 0 — ns
— 20 — 20 µs
— 5 — 5 ns
Device
Under
Test
CL
3.3 V
IN3064
or Equivalent
2.7 k
6.2 k
Diodes = IN3064
or Equivalent
Notes: CL = 30 pF including jig capacitance (MBM29DL800TA/BA-70)
CL = 100 pF including jig capacitance (MBM29DL800TA/BA-90)
Figure 4 Test Conditions
29

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]