M34551 Просмотр технического описания (PDF) - MITSUBISHI ELECTRIC

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M34551

SINGLE-CHIP 4-BIT CMOS MICROCOMPUTER for INFRARED REMOTE CONTROL TRANSMITTER

MITSUBISHI ELECTRIC  

MITSUBISHI MICROCOMPUTERS

4551 Group

SINGLE-CHIP 4-BIT CMOS MICROCOMPUTER for

INFRARED REMOTE CONTROL TRANSMITTER

(1) PROM mode

The built-in PROM version has a PROM mode in addition to

a normal operation mode. The PROM mode is used to write

to and read from the built-in PROM.

In the PROM mode, the programming adapter can be used

with a general-purpose PROM programmer to write to or read

from the built-in PROM as if it were M5M27C256K.

Programming adapter is listed in Table 21. Contact addresses

at the end of this book for the appropriate PROM programmer.

• Writing and reading of built-in PROM

Programming voltage is 12.5 V. Write the program in the

PROM of the built-in PROM version as shown in Figure

42.

Table 21 Programming adapter

Microcomputer

M34551E8-XXXFP, M34551E8FP

Programming adapter

PCA7414

Address

000016

1

1FFF16

1 1 D4 D3 D2 D1 D0

Low-order 5 bits

(2) Notes on handling

ΠA high-voltage is used for writing. Take care that

overvoltage is not applied. Take care especially at turning

on the power.

 For the One Time PROM version shipped in blank,

Mitsubishi Electric corp. does not perform PROM writing

test and screening in the assembly process and following

processes. In order to improve reliability after writing,

performing writing and test according to the flow shown in

Figure 43 before using is recommended.

400016 1

5FFF16

1 1 D4 D3 D2 D1 D0

High-order 5 bits

7FFF16

Set “FF16” to the shaded area.

Fig. 42 PROM memory map

(Products shipped in blank: PROM contents is not written in

factory when shipped)

Writing with PROM programmer

Screening (Leave at 150 °C for 40 hours) (Note)

Verify test with PROM programmer

Function test in target device

Note: Since the screening temperature is higher

than storage temperature, never expose the

microcomputer to 150°C exceeding 100

hours.

Fig. 43 Flow of writing and test of the product shipped in

blank

66

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