SST29EE512 Просмотр технического описания (PDF) - Silicon Storage Technology

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производитель

SST29EE512

512 Kbit (64K x8) Page-Mode EEPROM

Silicon Storage Technology 

512 Kbit Page-Mode EEPROM

SST29EE512 / SST29LE512 / SST29VE512

Data Sheet

VIHT

VILT

INPUT

VHT

VLT

REFERENCE POINTS

VHT

VLT

OUTPUT

301 ILL F12.1

AC test inputs are driven at VIHT (2.4V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points for

inputs and outputs are VHT (2.0 V) and VLT (0.8 V). Input rise and fall times (10% ↔ 90%) are <10 ns.

FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS

Note: VHT - VHIGH Test

VLT - VLOW Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

TO DUT

TEST LOAD EXAMPLE

TO TESTER

CL

RL LOW

VDD

RL HIGH

FIGURE 14: A TEST LOAD EXAMPLE

301 ILL F13.1

©2001 Silicon Storage Technology, Inc.

17

S71060-06-000 6/01 301

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