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LTC3541EDD-3 Просмотр технического описания (PDF) - Linear Technology

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LTC3541EDD-3
Linear
Linear Technology Linear
LTC3541EDD-3 Datasheet PDF : 20 Pages
First Prev 11 12 13 14 15 16 17 18 19 20
LTC3541-3
APPLICATIO S I FOR ATIO
equal to logic high), efficiency is typically dominated by
the loss across the linear regulator output device and VIN
quiescent current. In a typical efficiency plot, the efficiency
curve at very low load currents can be misleading since
the actual power lost is of little consequence.
1. The VIN quiescent current loss in the buck is due to two
components: the DC bias current as given in the Electrical
Characteristics and the internal main switch and synchro-
nous switch gate charge currents. The gate charge current
results from switching the gate capacitance of the internal
power switches. Each time the gate is switched from high
to low to high again, a packet of charge, dQ, moves from
VIN to ground. The resulting dQ/dt is the current out of
VIN that is typically larger than the DC bias current and
proportional to frequency. Both the DC bias and gate charge
losses are proportional to VIN and thus their effects will
be more pronounced at higher supply voltages.
2. I2R losses are calculated from the resistances of the
internal switches, RSW, and external inductor RL. In con-
tinuous mode, the average output current flowing through
inductor L is “chopped” between the main switch and the
synchronous switch. Thus, the series resistance looking
into the SW pin is a function of both top and bottom
MOSFET RDS(ON) and the duty cycle (DC) as follows:
RSW = (RDS(ON)TOP)(DC) + (RDS(ON)BOT)(1 – DC)
The RDS(ON) for both the top and bottom MOSFETs can
be obtained from the Typical Performance Characteristics
curves. Thus, to obtain I2R losses, simply add RSW to
RL and multiply the result by the square of the average
output current.
3. Losses in the VLDO/linear regulator are due to the DC bias
currents as given in the Electrical Characteristics and to the
(VIN – VOUT) voltage drop across the internal output device
transistor.
Other losses when the buck and VLDO regulator are
in operation (ENBUCK and ENVLDO equal logic high),
including CIN and COUT ESR dissipative losses and induc-
tor core losses, generally account for less than 2% total
additional loss.
THERMAL CONSIDERATIONS
The LTC3541-3 requires the package backplane metal
(GND pin) to be well soldered to the PC board. This gives
the DFN package exceptional thermal properties. The
power handling capability of the device will be limited
by the maximum rated junction temperature of 125°C.
The LTC3541-3 has internal thermal limiting designed to
protect the device during momentary overload conditions.
For continuous normal conditions, the maximum junction
temperature rating of 125°C must not be exceeded. It is
important to give careful consideration to all sources of
thermal resistance from junction to ambient. Additional
heat sources mounted nearby must also be considered.
For surface mount devices, heat sinking is accomplished
by using the heat-spreading capabilities of the PC board
and its copper traces. Copper board stiffeners and plated
through holes can also be used to spread the heat gener-
ated by power devices.
To avoid the LTC3541-3 exceeding the maximum junction
temperature, some thermal analysis is required. The goal
of the thermal analysis is to determine whether the power
dissipated exceeds the maximum junction temperature of
the part. The temperature rise is given by:
TR = PD qJA
where PD is the power dissipated by the regulator and qJA
is the thermal resistance from the junction of the die to
the ambient temperature.
The junction temperature, TJ, is given by:
TJ = TA + TR
where TA is the ambient temperature.
As an example, consider the LTC3541-3 at an input volt-
age VIN of 3V, an LVIN voltage of 1.8V provided by the buck
regulator, an LVOUT voltage of 1.575V, a load current of
300mA for the VLDO regulator, a load current of 200mA
for the buck (total load for buck = 500mA), and an ambient
temperature of 85°C. From the typical performance graph
of switch resistance, the RDS(ON) of the P-channel switch at
35413fc
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