LPC1102UK Просмотр технического описания (PDF) - NXP Semiconductors.
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LPC1102UK Datasheet PDF : 43 Pages
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NXP Semiconductors
LPC1102/1104
32-bit ARM Cortex-M0 microcontroller
Table 6. ADC static characteristics
Tamb = 40 C to +85 C unless otherwise specified; ADC frequency 4.5 MHz, VDD = 2.5 V to 3.6 V.
Symbol
Parameter
Conditions
Min
Typ
VIA
Cia
ED
EL(adj)
EO
EG
ET
Rvsi
analog input voltage
analog input capacitance
differential linearity error
integral non-linearity
offset error
gain error
absolute error
voltage source interface
resistance
0
-
-
-
[1][2] -
-
[3] -
-
[4] -
-
[5] -
-
[6] -
-
-
-
Ri
input resistance
[7][8] -
-
Max
VDD
1
1
1.5
3.5
0.6
4
40
2.5
Unit
V
pF
LSB
LSB
LSB
%
LSB
k
M
[1] The ADC is monotonic, there are no missing codes.
[2] The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 5.
[3] The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 5.
[4] The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 5.
[5] The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 5.
[6] The absolute error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated
ADC and the ideal transfer curve. See Figure 5.
[7] Tamb = 25 C; maximum sampling frequency fs = 400 kSamples/s and analog input capacitance Cia = 1 pF.
[8] Input resistance Ri depends on the sampling frequency fs: Ri = 1 / (fs Cia).
LPC1102_1104
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 26 September 2013
© NXP B.V. 2013. All rights reserved.
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