5.3.1
Peripheral operating requirements and behaviors
Thermal operating requirements
Table 9. Thermal operating requirements
Symbol
TJ
TA
Description
Die junction temperature
Ambient temperature
Min.
Max.
Unit
–40
125
°C
–40
105
°C
5.3.2 Thermal attributes
Board Symbol
type
Single-layer RθJA
(1s)
Four-layer RθJA
(2s2p)
Single-layer RθJMA
(1s)
Four-layer RθJMA
(2s2p)
—
RθJB
—
RθJC
—
ΨJT
Description
Thermal resistance, junction to ambient (natural
convection)
Thermal resistance, junction to ambient (natural
convection)
Thermal resistance, junction to ambient (200 ft./min.
air speed)
Thermal resistance, junction to ambient (200 ft./min.
air speed)
Thermal resistance, junction to board
Thermal resistance, junction to case
Thermal characterization parameter, junction to
package top outside center (natural convection)
100 LQFP Unit
TBD
°C/W
TBD
°C/W
TBD
°C/W
TBD
°C/W
TBD
TBD
TBD
°C/W
°C/W
°C/W
Notes
1
1
1
1
2
3
4
1.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air), or EIA/JEDEC Standard JESD51-6, Integrated Circuit Thermal Test Method
Environmental Conditions—Forced Convection (Moving Air).
6 Peripheral operating requirements and behaviors
All digital I/O switching characteristics assume:
1. output pins
• have CL=30pF loads,
• are configured for fast slew rate (PORTx_PCRn[SRE]=0), and
• are configured for high drive strength (PORTx_PCRn[DSE]=1)
2. input pins
• have their passive filter disabled (PORTx_PCRn[PFE]=0)
6.1 Core modules
K20 Sub-Family Data Sheet Data Sheet, Rev. 4, 3/2011.
Freescale Semiconductor, Inc.
Preliminary
19