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GET-30569

Qualification Test Results on NE272 series

California Eastern Laboratories. 

This report presents

the qual ification

test results-on-NE272

series.

2/8

-1- .Test

Device

NE272

AI GaAs /In

GaAs hetero-junction

-

FEr

2.Qualification

tests

A serres

of Qual ification

tests

consists

of following

rierns

l)High temperature

2)High temperature

The test

The test

conditions

parameters

DC Bias Test ( H T p T )

Reverse Bias Test ( H T R B T )

and sample size are shown in Table 1.

were measured before and after the tests.

bk~t

Resu lli

The summary of qual ification

test result

is presented

in Table 3-1,3-2.

l)High Temperature

The followingfcondition

DC Bias Test

has been adopted:

VDs=2V ID=10mA T ch= 175°C

The test results

are shown in Table 3-1 and Fig.1 (1)-Fig.1(8)

The test elapsed for 5000 hours under the above condition.

The changes of all parameters

are withjn the delta crilteria.

2)High temperature

DC Bias Test

The following

condition

has been adopted:

VGDS=. '4V

T ch= 150°C

The test

results

are shown in Table 3-2 and Fig.2(1)-F:jg.2(8).

The test

elapsed

for 5000 hours under the above condition.

The changes

of all parameters

are within

the delta

criteria.

4.Conclusion

From the series

of qual ification

test results

described

above

t is concluded

that:

l)There is no degradation

DC bias test.

2) There is no degradation

Reverse bias test.

UP to 5000 hours at Tch=l75°C in High temperature

UP to 5000 hours at Tch=lSO°C in High temperature

NE272 is qua fied

for

high

rei iabi

ity appl ications.

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