AD7570 Просмотр технического описания (PDF) - Analog Devices
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AD7570 Datasheet PDF : 12 Pages
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TYPICAL PERFORMANCE CHARACTERISTICS
1000.0
100,0
VDD : +15V
CLK IN : 0 TO +3V (VCC : +5VI,
0 TO +15V IVcc : +15VI
CONVERSION.TO.STANDBY DUTY CYCLE: 80%
HBEN, LBEN, BSEN, COMP, SClf.: Vcc
~
.y 10.0
0
_0
1.0
+0.25
+0.20
+0.15
>-
~ +0,10
~
;::. +0.05
~0z=''"jj
0
<!~
~', -0.05
~ -0.10
~
is -0,15
AD7570J
}AD7570L
.0.20
0.1
100
lk
10k
lOOk
-0,25
5
10 11 12 13 14 15
CLOCK FREOUENCY - H,
Figure " IDD, Ice vs. fCLK at Different Temperatures
1M
OBlOOk 1---,-
S :I,:
~
O u
~ L ~ 10k
VDD: +15V Vcc
TA:25C
R
22
24
~ E C
AD7570
T GENERATING INTERNAL CLK
E lk
[ II
VDD - VOL TS
Figure 3, Differential Nonlinearity vs. VDD
0.35
0.30
~ 0.25
."
~", 0.20
0:
0
00:: 0.15
w
z
~ 0.10
0.05
10
100
lk
10k
0.00
5
10 11 12 13 14 15
CAPACITANCE - pF
VDD - VOL TS
Figure 2. fCLK vs. Rand Cat Vce = +5V, +15V
Figure 4, Gain Error vs. VDD (Normalized for VDD = 15V)
TEST CIRCUITS
-10V
+15V
+5V
0 TO .10V
SW.l
--BIT 1
I (MSBI
I BIT 10
-BIT 11
BIT 12
12 BIT
DAC
1M
(LSBI
10 BIT
TEST
rv
ANALOG DITHER INPUT
5-40 H, SINE WAVE.
lOV P1'
100kH, CLOCK
CONVERT START
3k
250k
8 BIT
TEST
~3
LBENI21
HBEN
20
BSEN
27
10.BIT,
TEST
DUT 23
sc8126 AD7570
7
8B'J1,
TESV
161 DB3
..9:.!i 24
STRT
25
18
19 D80 (LSB)
28 I BUSY 10 BIT TEST
0.5", PULSE DN 130", INTERVALS. TRAILING
EDGE SYNCED TO CLOCK LEADING EDGEI
OSCILLOSCOPE
HORIZONTAL
(X) INPUT
6
VERTICAL
(YI INPUT
NOTE, ADJUST COMPARATOR IAD311 I OFFSET TO LESS THAN O1mV.
20k
01
02
10k
DUAL "D"
TYPE LATCH
Figure 5. Dynamic Crossplot Accuracy Test
-4-
t
8
8
8
e
III
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