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EVAL-AD5750EBZ(RevF) Просмотр технического описания (PDF) - Analog Devices

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EVAL-AD5750EBZ Datasheet PDF : 36 Pages
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AD5750/AD5750-1/AD5750-2
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. Transient currents of up to
100 mA do not cause SCR latch-up.
Table 4.
Parameter
Rating
AVDD to GND
−0.3 V to +30 V
AVSS to GND
+0.3 V to −28 V
AVDD to AVSS
−0.3 V to +58 V
DVCC to GND
−0.3 V to +7 V
VSENSE+ to GND
AVSS to AVDD
VSENSE− to GND
±5.0 V
Digital Inputs to GND
−0.3 V to DVCC + 0.3 V or
+7 V (whichever is less)
Digital Outputs to GND
−0.3 V to DVCC + 0.3 V or
+7 V (whichever is less)
VREF to GND
−0.3 V to +7 V
VIN to GND
−0.3 V to +7 V
VOUT, IOUT to GND
AVSS to AVDD
Operating Temperature Range,
Industrial
−40°C to +105°C
Storage Temperature Range
−65°C to +150°C
Junction Temperature (TJ max)
125°C
32-Lead LFCSP Package
θJA Thermal Impedance1
42°C/W
Lead Temperature
JEDEC industry standard
Soldering
J-STD-020
ESD (Human Body Model)
3 kV
1 Simulated data based on a JEDEC 2S2P board with thermal vias.
Data Sheet
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. F | Page 10 of 36

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