MAX3341E Просмотр технического описания (PDF) - Maxim Integrated

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производитель

MAX3341E

±15kV ESD-Protected USB Level Translator in UCSP with USB Detect

Maxim Integrated 

±15kV ESD-Protected USB Level Translator in

UCSP with USB Detect

3.3V

D+

1.5kΩ

23.7Ω

TEST POINT

CL

15kΩ

MAX3341E

D-

23.7Ω

TEST POINT

CL

15kΩ

USB_DET

25pF

(b) LOAD FOR D+, D-, AND USB_DET

Figure 6. Test Circuits

Table 2. Reliability Test Data

TEST

Temperature Cycle

Operating Life

Moisture Resistance

Low-Temperature Storage

Low-Temperature

Operational

Solderability

ESD

High-Temperature Operating

Life

CONDITIONS

-35°C to +85°C,

-40°C to +100°C

TA = +70°C

+20°C to +60°C, 90% RH

-20°C

-10°C

8hr steam age

±2000V, Human Body Model

TJ = +150°C

Chip Information

TRANSISTOR COUNT: 2162

PROCESS: BiCMOS

MAX3341E

VMI OR VPI OR RCV

TEST POINT

25pF

(a) LOAD FOR VPI, VMI, AND RCV

MAX3341E

24Ω

D+ OR D-

TEST POINT

200Ω

50pF

+ GND

- OR VCC

(c) LOAD FOR ENABLE AND DISABLE TIME, D+/D-

DURATION

150 cycles,

900 cycles

240hr

240hr

240hr

24hr

—

—

168hr

NO. OF FAILURES PER

SAMPLE SIZE

0/10,

0/200

0/10

0/10

0/10

0/10

0/15

0/5

0/45

12 ______________________________________________________________________________________

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