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STB7NK80Z Просмотр технического описания (PDF) - STMicroelectronics

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STB7NK80Z Datasheet PDF : 17 Pages
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STB7NK80Z, STB7NK80Z-1, STP7NK80ZFP, STP7NK80Z
Electrical characteristics
Table 7.
Symbol
Source drain diode
Parameter
Test conditions
ISD
ISDM(1)
VSD(2)
Source-drain current
Source-drain current (pulsed)
Forward on voltage
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD = 5.2 A, VGS = 0
ISD = 5.2 A, di/dt = 100
A/µs
VDD = 50 V, Tj = 150°C
(see Figure 22)
1. Pulsed: pulse duration=300µs, duty cycle 1.5%
2. Pulse width limited by safe operating area
Min. Typ. Max. Unit
5.2 A
-
20.8 A
-
1.6 V
530
ns
- 3.31
µC
12.5
A
Table 8.
Symbol
Gate-source zener diode
Parameter
Test conditions
Min. Typ. Max. Unit
BVGSO Gate-source breakdown voltage IGS= ± 1mA (open drain) 30
V
The built-in back-to-back Zener diodes have specifically been designed to enhance not only
the device’s ESD capability, but also to make them safely absorb possible voltage transients
that may occasionally be applied from gate to source. In this respect the Zener voltage is
appropriate to achieve an efficient and cost-effective intervention to protect the device’s
integrity. These integrated Zener diodes thus avoid the usage of external components.
Doc ID 8979 Rev 6
5/17

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